The testing and verification of semiconductor chips was a prominent topic at this year’s European Test Systems (ETS) conference, especially in the area of Design-for-Test (DFT) tools and techniques.

Taken literally, embedded test is just that: test capabilities that exist wholly embedded within a system. Power-on self-test is an example as is a built-in performance-monitoring feature programmed ...

New manufacturing test challenges are raised with SoC technology advances where both test quality and test costs are affected with a direct impact on current Design-For-Test (DFT) methodologies and ...