As process technologies continue to shrink and memory size and design complexity grow, it has become increasingly difficult to achieve high manufacturing yield. Embedded memories are the most dense ...

Applications such as smart cards and devices used in the defense industry require security features to ensure that sensitive data is inaccessible to outside agents. This used to be a niche requirement ...

Advances in very deep-submicron process technology require corresponding investments in design and test. Design infrastructure enabling the achievements of advanced design capability is well ...

Having explained in part 1 the nature of the memory test challenge in the industry today, this article discusses non-intrusive debug and test methods based on embedded instruments and how these ...