The trend in semiconductors leads to more IC test data volume, longer test times, and higher test costs. Embedded deterministic test (EDT) has continued to deliver more compression, which has been ...
Compression tests are used to characterize various compressive properties such as the compression modulus and compressive strength. They are performed on fiber-reinforced composites with ...
Synopsys has announced DFT Compiler MAX, its next-generation DFT synthesis solution, offering 1-pass test data volume compression capabilities to address design and test challenges occurring in 130-nm ...
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