The evolutionary path of semiconductor ATE (automated test equipment) seemed clear at Semicon West, held July 13–15 in San Francisco. Gone are the expensive, big-iron functional testers of yesterday, ...
Representing the most recent generation of double-data-rate (DDR) SDRAM memory, DDR4 and low-power LPDDR4 together provide improvements in speed, density, and power over DDR3. However, such speed and ...
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