Test engineers often are challenged with the task of simulating the environment in which the unit under test (UUT) will operate. To implement such a test, engineers use hot mock-up, embedded software, ...
Production test of a finished electronic product often involves two techniques: in-circuit test (ICT) and functional component test (FCT). The ICT technique examines a non-powered circuit board to ...
As chips become more heterogeneous with more integrated functionality, testing them presents increasing challenges — particularly for high-speed system-on-chip (SoC) designs with limited test pin ...
Many books cover functional testing techniques, but relatively few also cover technical testing. “The Software Test Engineer’s Handbook, 2nd Edition” (US$49.95, 560 pages) from O’Reilly fills that gap ...
Over the last decade, there has been a move away from powered-up digital in-circuit vector testing to unpowered analog-based (vectorless) device-pin opens testing for large and sometimes small digital ...
Microprocessor testing and self-test techniques constitute a critical domain in ensuring the reliability and performance of modern computing devices. These methodologies encompass both hardware and ...
Balancing yield and test is essential to semiconductor manufacturing, but it’s becoming harder to determine how much weight to give one versus the other as chips become more specialized for different ...
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