Two test strategies are used to test virtually all IC logic—automatic test pattern generation (ATPG) with test pattern compression, and logic built-in self-test (BIST). For many years, there was a ...

When designing a chip, a designer needs to consider many tradeoffs before developing the logic. For example, if a chip is being developed for mobile applications, power becomes a very important factor ...

Unlock the full InfoQ experience by logging in! Stay updated with your favorite authors and topics, engage with content, and download exclusive resources. Vivek Yadav, an engineering manager from ...

Low- and no-code development have become key for digital transformation, giving information workers the tools to build the apps they need. There’s a significant app gap, one that under-resourced ...