Automated test equipment (ATE) describes testing apparatuses designed to perform a single or sequence of tests on one device or multiple devices at a time. Different types of ATE test electronics, ...
A recent design idea, “Negative time-constant and PWM program a versatile ADC front end,” offered a pretty peculiar ADC front end (see Figure 1). It comprises a programmable gain (PG) instrumentation ...
Some applications require the monitoring of power applied to a system. Microchip Technology addressed this need with the MCP39F511A, a highly integrated, single-phase power-monitoring IC intended for ...
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