Explore how moving measurement closer to the machining process with robust systems can improve manufacturing efficiency and ...

Unpatterned wafer inspection, which has flown well under the radar for most of the semiconductor industry, is becoming more critical amid the need to find defects earlier in the manufacturing process ...

Applied Materials has launched a new generation of optical semiconductor wafer inspection machines that incorporate big data and AI techniques. These multimillion-dollar machines are used in chip ...

For decades, optical inspection has been the primary method for process control in fabs. However, the move to multi-level ...