When contamination defects surface in advanced nodes, the root cause often spans tools, materials, and handling. This piece outlines how defect mapping, TEM, and SPC data converge to prove causation.

Researchers developed ceramic membranes with near-defect-free surfaces that filter dyes from wastewater at tap-water pressure, cutting energy use in water treatment.

Science X is a network of high quality websites with most complete and comprehensive daily coverage of the full sweep of ...

Dr. Hong-Ju Lee and Dr. In-Hyuk Song of the Nano Materials Research Division at the Korea Institute of Materials Science ...

Not all defects are visible with the same microscope. Explore how resolution, contrast, and signal interpretation shape semiconductor failure investigations.

Detecting macro-defects early in the wafer processing flow is vital for yield and process improvement, and it is driving innovations in both inspection techniques and wafer test map analysis. At the ...

This diagram depicts how metals with a smoother surface are less prone to the accumulation of hydrogen-induced defects, namely dislocations and vacancy clusters. As the world strives to achieve carbon ...

Defect states refer to electronic energy levels that arise from imperfections or irregularities in the crystal structure of materials, particularly in semiconductors and insulators. These ...

Variation is becoming a bigger problem in multi-die assemblies with TSVs and hybrid bonding. Multi-modal approaches are required to test these devices. AI plays a role in improving defect capture rate ...