Modulation bandwidths continue to grow, promising higher data rates yet imposing test difficulties. Most test technologies are still rooted in past, narrowband architectures, which are increasingly ...
To improve yield, quality, and cost, two separate test parameters can be combined to determine if a part passes or fails. The results gleaned from that approach are more accurate, allowing test and ...
www.quadtech.comOver the past 3-1/2 years, microprocessor current has increased by a factor of 5 and equivalent series resistance (ESR) has dropped by a factor of 7. Next-generation microprocessors ...
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