The Ellipsometry is a total optical measurement method. This technique is used to measure the change of polarization of light when passing through a medium. Due to the layer structure during ...

In the field of physical optics, a propagating light beam is known as a propagating electromagnetic radiation, with the direction of propagation being horizontal to the direction of the electric and ...

Imaging spectroscopic ellipsometry delivers nanometer-level sensitivity and spatial resolution, addressing the limitations of conventional metrology techniques.

In semiconductor device applications, there is an increasing demand for semiconductors with very high carrier concentrations. The semiconductor material parameters, namely carrier density and mobility ...

This free of charge workshop is aimed at both experienced ellipsometry users as well as people new to ellipsometry. The format of the workshop includes an introduction, fundamentals of ellipsometric ...

Researchers have used an extremely bright mid-infrared laser to perform an analytical technique known as spectroscopic ellipsometry. The new approach captures high-resolution spectral information in ...

Myungkoo Kang (left), S.K. Sundaram (center), and Mehdi Kabir. Alfred University is recipient of a National Science Foundation (NSF) grant of nearly $350,000, which will be used to acquire equipment ...

Metrology supplier Nanometrics Inc. today unveiled an integrated metrology tool combining ultraviolet spectroscopic ellipsometry and deep ultraviolet (DUV) spectroscopic reflectometry. In dielectric ...

We use several techniques to characterize the monolayer formed in air by the electron transfer protein, azurin, self-assembled on a gold substrate in a stable way. Tapping Mode Atomic Force Microscopy ...

As some of you may know, I have recently made the move from optics, lasers, and fun, to… um… surface science, chemistry and, well other kinds of fun. As far as I ...