Tessent MemoryBIST from Siemens EDA provides a complete solution for at-speed test, diagnosis, repair, debug and characterization of embedded memories. Leveraging a flexible hierarchical architecture, ...
As memory bit cells of any type become smaller, bit error rates increase due to lower margins and process variation. This can be dealt with using error correction to ...
NAND flash memory underpins a vast array of modern electronic devices, yet its increasing storage densities and shrinking semiconductor geometries have exacerbated ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results